HRD 3000

High Resolution X-ray Diffractometer.

The HRD 3000 high resolution diffraction system incorporates the most advanced digital electronics, computers and Microsoft’s Windows 98/ME/2000/XP operating system. Exact angular positions of the goniometer circles are guaranteed by a well-devised combination of stepping motors and optical encoders. The goniometer circles are positioned at high speed.
The HRD 3000 diffractometer system can be used on a wide range of analytical problems, from texture to thin film analysis, strain measurements and reflectometry.
With this high performance, high resolution diffractometer, you can obtain outstanding results with amazing ease, when determining layer thickness and composition in semiconductors. The high resolution reflectometry studies can be performed with the HRD 3000 to characterise layer thickness, density, surface and interface roughness.
Seven independent degrees of movement freedom, allowing every possible sample position.
The high efficiency of the various components permits analytical results of high quality.
Different kind of source and optical components, several detectors and special attachments can be added to meet all your requirements. You have the choice of a large number easily mounted components. For more information on our system, attachments, and custom design accessories, contact us directly.
Powerful, user-friendly software makes measurement easier than ever and includes many sophisticated features to aid in the interpretation of the results.